CEN 475: VLSI Design and Testing

Offered Under: B.Sc. in Computer Engineering (CEN)
Description

VLSI Technology: MOS transistor and inverter characteristics, complex CMOS gates and functional circuits. Design and operation of large fan-out and fan-in circuits; Clocking methodologies; Techniques for data path and data control design. VLSI layout partitioning, placement routine, and writing in VLSI Reliability aspects and testing of VLSI.


Prerequisites:
  • None

Course Type Major
Credit Hour 3
Lecture Hour 45
Expected Outcome(s):
  • Model and simulate digital VLSI systems using a hardware design language.
  • Understand of the characteristics of CMOS circuit construction and the comparison between different state-of-the-art CMOS technologies and processes.
  • Create models of moderately sized CMOS circuits that realize specified digital functions.
  • Describe and avoid common CMOS circuit pitfalls and reliability problems.
  • Evaluate trends in semiconductor technology, and how they impact scaling and performance.
  • Understand VLSI design methodologies - the various steps and tools, the implementation choices, and good architecture practices.

Suggested Books:

Basic VLSI Design: Systems and Circuits by Douglas A. Pucknell, Kamran Eshraghian


Grading Policy:

Biweekly Quiz, One Midterm Exam, One Final Exam, Project


Letter Grade Marks Grade Point
A 90 - 100 4.00
A- 85 - 89 3.70
B+ 80 - 84 3.30
B 75 - 79 3.00
B- 70 - 74 2.70
C+ 65 - 69 2.30
C 60 - 64 2.00
C- 55 - 59 1.70
D+ 50 - 54 1.30
D 45 - 49 4.00
F 00 - 44 4.00